No 1 (2021) Technical mechanics
UDC 537.87; 621.372
Technical mechanics, 2021, 1, 84 - 91
Ìodel of h-polarized wave propagation in a multilayer dielectric structure
Zabolotnyi P. ².
Zabolotnyi P. ².
Institute of Technical Mechanics of the National Academy of Sciences of Ukraine and the State Space Agency of Ukraine
This paper addresses the determination of the dielectric constant of multilayer dielectric structures. One of
the most-used methods for determining the dielectric constant of multilayer structures is reflection
coefficient measurement by interferometry. In the general case, in interferometry measurements to one
measured value of the reflection coefficient there may correspond an infinity of dielectric constants. This
ambiguity may be resolved by first determining the effect of different parameters of the probing
electromagnetic wave on the reflection coefficient. In particular, it is important to have a preliminary
estimate of the effect of the incidence angle and the polarization on the range of variation of the
reflection coefficient with the variation of one of the structure parameters. This allows one to estimate
the boundaries of the range of variation of the reflection coefficient with the variation of the parameter
This paper considers the case where a plane H-polarized electromagnetic wave, i.e. a wave whose magnetic field
is perpendicular to the incidence plane, is incident on a multilayer dielectric structure. The aim of this
work is to develop a model of the propagation of an H-polarized electromagnetic wave through a multilayer
dielectric structure at an arbitrary incidence angle and to determine the range of variation of the reflection
coefficient with the variation of the dielectric constants of the layers. The paper presents a model of the
propagation of an H-polarized electromagnetic wave in a two-layer dielectric structure. A metal base, which
is an ideal conductor, underlies the structure. The electromagnetic wave is incident from the air at an
arbitrary incidence angle. The model allows one to estimate the reflection coefficient of the structure as
a function of its parameters and the incidence angle. The model also makes it possible to analytically
estimate the range of variation of the reflection coefficient with the variation of the dielectric constant
and the thickness of each layer of the structure. Using the model, the magnitude of the reflection
coefficient was determined as a function of the incidence angle and the dielectric constant of the second
H-polarization, dielectric constant, reflection coefficient, multilayer dielectric structures
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